libri scuola books Fumetti ebook dvd top ten sconti 0 Carrello


Torna Indietro

pandit soumya; mandal chittaranjan ; patra amit - nano-scale cmos analog circuits

Nano-scale CMOS Analog Circuits Models and CAD Techniques for High-Level Design

; ;




Disponibilità: Normalmente disponibile in 20 giorni
A causa di problematiche nell'approvvigionamento legate alla Brexit sono possibili ritardi nelle consegne.


PREZZO
195,98 €
NICEPRICE
186,18 €
SCONTO
5%



Questo prodotto usufruisce delle SPEDIZIONI GRATIS
selezionando l'opzione Corriere Veloce in fase di ordine.


Pagabile anche con Carta della cultura giovani e del merito, 18App Bonus Cultura e Carta del Docente


Facebook Twitter Aggiungi commento


Spese Gratis

Dettagli

Genere:Libro
Lingua: Inglese
Editore:

CRC Press

Pubblicazione: 02/2014
Edizione: 1° edizione





Note Editore

Reliability concerns and the limitations of process technology can sometimes restrict the innovation process involved in designing nano-scale analog circuits. The success of nano-scale analog circuit design requires repeat experimentation, correct analysis of the device physics, process technology, and adequate use of the knowledge database. Starting with the basics, Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design introduces the essential fundamental concepts for designing analog circuits with optimal performances. This book explains the links between the physics and technology of scaled MOS transistors and the design and simulation of nano-scale analog circuits. It also explores the development of structured computer-aided design (CAD) techniques for architecture-level and circuit-level design of analog circuits. The book outlines the general trends of technology scaling with respect to device geometry, process parameters, and supply voltage. It describes models and optimization techniques, as well as the compact modeling of scaled MOS transistors for VLSI circuit simulation. • Includes two learning-based methods: the artificial neural network (ANN) and the least-squares support vector machine (LS-SVM) method • Provides case studies demonstrating the practical use of these two methods • Explores circuit sizing and specification translation tasks • Introduces the particle swarm optimization technique and provides examples of sizing analog circuits • Discusses the advanced effects of scaled MOS transistors like narrow width effects, and vertical and lateral channel engineering Nano-Scale CMOS Analog Circuits: Models and CAD Techniques for High-Level Design describes the models and CAD techniques, explores the physics of MOS transistors, and considers the design challenges involving statistical variations of process technology parameters and reliability constraints related to circuit design.




Sommario

Introduction Introduction Characterization of Technology Scaling Analog Design Challenges in Scaled CMOS Technology Motivation for CAD Techniques Conventional Design Techniques for Analog IC Design Knowledge-based CAD Technique for Analog ICs Summary and Conclusion High-Level Modeling and Design Techniques Introduction High-Level Model Behavioral Model Generation Technique Introduction to Optimization Techniques Some Important Optimization Algorithms Multi-Objective Optimization Method Pareto Optimal Front Design Space Exploration Computational Complexity of a CAD Algorithm Technology aware Computer Aided IC Design Technique Commercial Design Tools Modeling of Scaled MOS Transistor for VLSI Circuit Simulation Introduction Device Modeling Compact Models Long-Channel MOS Transistor Threshold Voltage Model for Long-channel Transistor with Uniform Doping SPICE Level Drain Current Model SPICE Level I-V Model MOSFET Capacitances Short-Channel MOS Transistor Threshold Voltage for Short-Channel MOS Transistor I-V Model for Short-Channel MOS transistor Weak Inversion Characteristics of a Scaled MOS transistor Hot Carrier Effect Source-Drain Resistance Model Compact Modeling Salicide Technology Physical Model for Output Resistance Poly-silicon Gate Depletion Effect Effective Channel Length and Width Summary and Conclusion Performance and Feasibility Model Generation using Learning based Approach Introduction Requirement of Leaning-based Approaches Regression Problem for Performance Model Generation Some Related Works Preliminaries on Artificial Neural Network Neural Network Model Development Case Study 1: Performance Modeling of CMOS Inverter Case Study 2: Performance Modeling of Spiral Inductor Dynamic Adaptive Sampling Introduction to Least Squares Support Vector Machines Feasible Design Space and Feasibility Model Case Study 3: Combined Feasibility and Performance Modeling of Two-Stage Operational Amplifier Case Study 4: Architecture-Level Performance Modeling of Analog Systems Meet-in-the-Middle Approach for Construction of Architecture-Level Feasible Design Space Case Study 5: Construction of FeasibilityModel at Architecturelevel of an Interface Electronics for MEMS Capacitive Accelerometer System Summary and Conclusion Circuit Sizing and Specification Translation Introduction Circuit Sizing as a Design Space Exploration Problem Particle Swarm Optimization Algorithm (PSO) Case Study 1: Design of a Two Stage Miller OTA Case Study 2: Synthesis of On-chip Spiral Inductors Case Study 3: Design of a nano-scale CMOS inverter for Symmetric Switching Characteristics The gm/ID Methodology for Low Power Design High-Level Specification Translation Summary and Conclusion Advanced Effects of Scaled MOS Transistors Introduction Narrow Width Effect on Threshold Voltage Channel Engineering of MOS Transistor Gate Leakage Current High-? Dielectrics and Metal-Gate/High-? CMOS Technology Advanced Device Structures of MOS Transistors Noise Characterization of MOS Transistors Gate Resistance and Substrate Network Model of MOS Transistor for RF Applications Summary and Conclusion Process Variability and Reliability of Nano-scale CMOS Analog Circuits Introduction Basic Concepts on Yield and Reliability Sources of Variations in Nanometer Scale Technology Systematic Process Variations Random Process Variations Statistical Modeling Physical Phenomena Affecting the Reliability of Scaled MOS Transistor Physical Model for MOSFET Degradation due to HCI Reaction-Diffusion Model for NBTI Reliability Simulation for Analog Circuits Summary and Conclusion Bibliography




Autore

Soumya Pandit received a B.Sc degree with Physics Honors, M.Sc degree in electronic science from University of Calcutta in 1998 and 2000, and an M.Tech degree in radio physics and electronics from the same university in 2002. He obtained his PhD degree from Indian Institute of Technology, Kharagpur in information technology in the year 2009. His current research activities are on statistical CMOS analog circuit design and optimization, process-device-circuit interaction, and soft computing applications. Dr. Pandit has to his credit several international journal and conference publications. He is a member of IEEE, USA and an associate member of the Institute of Engineers (India). Chittaranjan Mandal received his PhD from the Indian Institute of Technology, Kharagpur, India, in 1997. He is currently a professor in the Department of Computer Science and Engineering and also the School of Information Technology at IIT, Kharagpur. His research interests include high-level system design, formal modeling, and verification. He has been an Industrial Fellow of Kingston University, UK, since 2000 and was also a recipient of a Royal Society Fellowship for conducting collaborative research in the UK. He has handled sponsored projects from government agencies as well as private agencies such as Nokia, Natsem, and Intel. He also serves as a reviewer for several journals and conferences. Amit Patra received B.Tech., M.Tech., and Ph.D. degrees from the Indian Institute of Technology, Kharagpur in 1984, 1986, and 1990 respectively. He is currently a professor of electrical engineering at IIT Kharagpur where he served as the Dean (Alumni Affairs and International Relations) between 2007 and 2013. His current research interests include power management circuits, mixed-signal SoC design and embedded control systems. He has published more than 200 research papers and designed about 12 integrated circuits. He has carried out sponsored research with multiple industries such as National Semiconductor Corporation, Freescale Semiconductor, Infineon Technologies and Maxim Integrated Circuits.










Altre Informazioni

ISBN:

9781466564268

Condizione: Nuovo
Dimensioni: 9.25 x 6.25 in Ø 1.55 lb
Formato: Copertina rigida
Illustration Notes:179 b/w images and 36 tables
Pagine Arabe: 408


Dicono di noi