Materials Characterization Techniques

Presents the principles of surface and structural characterization techniques for quality assurance, contamination control, and process improvement. This book reviews popular and powerful analysis and quality control tools, explaining the appropriate uses and related technical requirements.

Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today—whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material’s structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use. Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement. This useful volume: Explores scientific processes to characterize materials using modern technologies Provides analysis of materials’ performance under specific use conditions Focuses on the interrelationships and interdependence between processing, structure, properties, and performance Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanisms, and materials Covers electron, X-ray-photoelectron, and UV spectroscopy; scanning-electron, atomic-force, transmission-electron, and laser-confocal-scanning-florescent microscopy, and gel electrophoresis chromatography Presents the fundamentals of vacuum, as well as X-ray diffraction principles Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations. Instead, they emphasize useful basic principles and applications of modern technologies used to characterize engineering materials, helping readers grasp micro- and nanoscale properties. This text will serve as a valuable guide for scientists and engineers involved in characterization and also as a powerful introduction to the field for advanced undergraduate and graduate students.

Preface Introduction Contact Angle in Surface Analysis Measuring Contact Angle Determining Surface Energy of a Homogeneous Solid Surface Work Examples X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy Atomic Model and Electron Configuration Principles of XPS and AES Instrumentation Routine Limits of XPS XPS Applications and Case Studies AES Applications Scanning Tunneling Microscopy and Atomic Force Microscopy Working Principle Instrumentation Modes of Operation Differences between STM and AFM Applications X-ray Diffraction X-ray Characteristics and Generation Lattice Planes and Bragg’s Law Powder Diffraction Thin Film Diffraction Texture Measurement Grazing Angle X-ray Diffraction Transmission Electron Microscopy Basics of Transmission Electron Microscopes Reciprocal Lattice Specimen Preparation Bright-Field and Dark-Field Images Electron Energy Loss Spectroscopy Scanning Electron Microscopy Introduction to Scanning Electron Microscopes Electron Beam–Specimen Interaction SEM Operating Parameters Applications Chromatographic Methods General Principles of Chromatography Ion Exchange Chromatography Gel Permeation Chromatography Gel Electrophoresis Chromatography High-Performance Liquid Chromatography Gas Chromatography Quantitative Analysis Methods Infrared Spectroscopy and UV/Vis Spectroscopy Infrared Radiation Spectroscopy Ultraviolet/Visible Spectroscopy Macro and Micro Thermal Analyses Macro and Micro Differential Scanning Calorimetry Isothermal Titration Calorimetry Thermogravimetric Analysis Laser Confocal Fluorescence Microscopy Fluorescence and Fluorescent Dyes Fluorescence Microscopy Laser Confocal Fluorescence Microscopy Applications of LCFM Index