Machine Learning Support for Fault Diagnosis of System-on-Chip

This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer returns. Readers will be enabled to deal with huge amount of insightful test data that cannot be exploited otherwise in an efficient, timely manner. After some background on fault diagnosis and machine learning, the authors explain and apply optimized techniques from the ML domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing. These techniques can be used for failure isolation in logic or analog circuits, board-level fault diagnosis, or even wafer-level failure cluster identification. Evaluation metrics as well as industrial case studies are used to emphasize the usefulness and benefits of using ML-based diagnosis techniques.

Introduction.- Prerequisites on Fault Diagnosis.- Conventional Methods for Fault Diagnosis.- Machine Learning and Its Applications in Test.- Machine Learning Support for Logic Diagnosis.- Machine Learning Support for Cell-Aware Diagnosis.- Machine Learning Support for Volume Diagnosis.- Machine Learning Support for Diagnosis of Analog Circuits.- Machine Learning Support for Board-level Functional Fault Diagnosis.- Machine Learning Support for Wafer-level Failure Cluster Identification.- Conclusion.

Patrick GIRARD received a M.Sc. degree in Electrical Engineering and a Ph.D. degree in Microelectronics from the University of Montpellier, France, in 1988 and 1992 respectively. He also received the “Habilitation à Diriger des Recherches” degree from the University of Montpellier, France, in 2003. He is currently Research Director at CNRS (French National Center for Scientific Research) and works in the Microelectronics Department of the Laboratory of Informatics, Robotics and Microelectronics of Montpellier (LIRMM) - France.

Patrick Girard was the founder and Editor-in-Chief of the ASP Journal of Low Power Electronics (JOLPE). He is an Associate Editor of the IEEE Transactions on Emerging Topics in Computing, the IEEE Transactions on Circuits and Systems I: Regular Papers, the IEEE Transactions on Circuits and Systems II: Express Briefs, and the Journal of Electronic Testing (JETTA - Springer). He was formerly an Associate Editor of the IEEE Transactions on VLSI Systems, IEEE Transactions on Computers, and IEEE Transactions on Computer-Aided Design of Circuits and Systems.

Patrick Girard has been involved in several (34) European research projects (ESPRIT III ATSEC, EUREKA MEDEA, MEDEA+ ASSOCIATE, IST MARLOW, MEDEA+ NanoTEST, CATRENE TOETS, ENIAC ELESIS, CATRENE MASTER_3D, PENTA HADES), national research projects (ANR, FUI), and industrial research projects with major companies like Infineon Technologies, Intel, Atmel, ST-Ericsson, STMicroelectronics, etc.

Patrick Girard has supervised 44 PhD dissertations, and has published 12 books or book chapters, 90 journal papers, and more than 250 conference and symposium papers. He is co-author of 5 patents. He is a Fellow of the IEEE and a Golden Core Member of the IEEE Computer Society.

Shawn Blanton is Joseph F. and Nancy Keithley Professor of Electrical and Computer Engineering at Carnegie Mellon University.   In   1995   he   received   his   Ph.D.   in   Electrical   Engineering   and Computer   Science   from   the   University   of   Michigan, Ann   Arbor.   His personal research interests include various aspects of integrated system testing and diagnosis, and the development of design methodologiesand tools for securing hardware systems. He has consulted for various  companies,  and  is  the founder of TestWorks, a Carnegie Mellon University spinout focused on information extraction from IC  test  data. He received a Career Award from the National Science Foundation in 1997, and IBM Faculty Partnership Awards in 2005 and 2006. He has given over 100 invited talks at universities and companies and is the recipient of several best-paper awards. He has published nearly 200 refereed conference and journal papers and has 10 U.S. patents or patent applications filed. He has served on various technical program committees and chaired the 2011 program for the International Test  Conference. Dr. Blanton is a fellow of the IEEE and senior member of the ACM.

Dr. Blanton has served as the Interim Vice Provost for Diversity, Equity, and Inclusion for Carnegie Mellon University 2020-21. In this interim role, he focused on diversifyingthe