libri scuola books Fumetti ebook dvd top ten sconti 0 Carrello


Torna Indietro
ARGOMENTO:  BOOKS > SCIENZA E TECNICA > FISICA

ziegler alexander (curatore); graafsma heinz (curatore); zhang xiao feng (curatore); frenken joost w.m. (curatore) - in-situ materials characterization

In-situ Materials Characterization Across Spatial and Temporal Scales

; ; ;




Disponibilità: Normalmente disponibile in 15 giorni


PREZZO
108,98 €
NICEPRICE
103,53 €
SCONTO
5%



Questo prodotto usufruisce delle SPEDIZIONI GRATIS
selezionando l'opzione Corriere Veloce in fase di ordine.


Pagabile anche con Carta della cultura giovani e del merito, 18App Bonus Cultura e Carta del Docente


Facebook Twitter Aggiungi commento


Spese Gratis

Dettagli

Genere:Libro
Lingua: Inglese
Editore:

Springer

Pubblicazione: 08/2016
Edizione: Softcover reprint of the original 1st ed. 2014





Trama

The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.




Sommario

Scanning Probe Microscopy on 'Live' Catalysts.- In-situ X-ray diffraction at synchrotron and Free-Electron-Laser sources.- Advanced in situ transmission electron microscopy.- Ultra-fast TEM and Electron Diffraction.- In-Situ Materials Characterization with FIB/SEM.- In-situ X-ray photoelectron spectroscopy.- “Real-time” probing of photo-induced molecular processes in liquids by ultrafast  X-ray absorption spectroscopy.- Time-Resolved Neutron Scattering.- Novel Detectors for Ultra-fast XRD, TEM and ED Characterization.










Altre Informazioni

ISBN:

9783662519769

Condizione: Nuovo
Collana: Springer Series in Materials Science
Dimensioni: 235 x 155 mm
Formato: Brossura
Illustration Notes:XI, 256 p. 124 illus., 78 illus. in color.
Pagine Arabe: 256
Pagine Romane: xi


Dicono di noi