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zhao yang; yan wei; sun jun; zhou mengxia; meng zhaojuan - electromagnetic compatibility

Electromagnetic Compatibility Principles and Applications

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Dettagli

Genere:Libro
Lingua: Inglese
Editore:

Springer

Pubblicazione: 12/2021
Edizione: 1st ed. 2021





Trama

This book highlights principles and applications of electromagnetic compatibility (EMC). After introducing the basic concepts, research progress, standardizations and limitations of EMC, the book puts emphasis on presenting the generation mechanisms and suppression principles of conducted electromagnetic interference (EMI) noise, radiated EMI noise, and electromagnetic susceptibility (EMS) problems such as electrostatic discharge (ESD), electric fast transient (EFT) and surge. By showing EMC case studies and solved examples, the book provides effective solutions to practical engineering problems. Students and researchers will be able to use the book as practical reference for EMC-related measurements and problem- solution.





Sommario

Chapter 1,Summary of electromagnetic compatibility.- Chapter 2. Conducted EMI noise generated mechanism, measurement and diagnosis.- Chapter 3. Conducted electromagnetic interference suppression methods and case studies.- Chapter 4. Radiated EMI noise generated mechanism, measurement and diagnosis.- Chapter 5. Radiated electromagnetic interference suppression methods and case study.- Chapter 6. Principle and analysis of electromagnetic susceptibility.- Chapter 7. Case study of electromagnetic susceptibility




Autore

Dr. Yang ZHAO is Professor at School of Electrical & Automation Engineering, Nanjing Normal University, and Director of Jiangsu Engineering Key Laboratory of Electrical Equipment and Electromagnetic Compatibility. He is mainly engaged in research and applications of electromagnetic compatibility, electronical engineering, and electric science and technology. 

Dr. Wei YAN is Associate Professor at School of Electrical & Automation Engineering, Nanjing Normal University.

Dr. Zhaojuan MENG is Associate Dean at School of Electrical & Automation Engineering, Nanjing Normal University. 











Altre Informazioni

ISBN:

9789811664519

Condizione: Nuovo
Dimensioni: 235 x 155 mm
Formato: Copertina rigida
Illustration Notes:IX, 232 p. 231 illus., 82 illus. in color.
Pagine Arabe: 232
Pagine Romane: ix


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