Nyquist AD Converters, Sensor Interfaces, and Robustness

TRAMA

This book is based on the 18 presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development. 

SOMMARIO

Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuits for MEMS Microphones.- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments.- Part III: Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.

ALTRE INFORMAZIONI

• Condizione: Nuovo
• ISBN: 9781489997944
• Dimensioni: 235 x 155 mm
• Formato: Brossura
• Illustration Notes: X, 294 p.
• Pagine Arabe: 294
• Pagine Romane: x