VLSI Design and Test

TRAMA

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

SOMMARIO

Digital design.- Analog/mixed signal.- VLSI testing.- Devices and technology.- VLSI architectures.- Emerging technologies and memory.- System design.- Low power design and test.- RF circuits.- Architecture and CAD.- Design verification.

ALTRE INFORMAZIONI

• Condizione: Nuovo
• ISBN: 9789811074691
• Collana: Communications in Computer and Information Science
• Dimensioni: 235 x 155 mm
• Formato: Brossura
• Illustration Notes: XXI, 815 p. 486 illus.
• Pagine Arabe: 815
• Pagine Romane: xxi