Design, Analysis and Test of Logic Circuits Under Uncertainty

TRAMA

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

SOMMARIO

Introduction.- Probabilistic Transfer Matrices.- Computing with Probabilistic Transfer Matrices.- Testing Logic Circuits for Probabilistic Faults.- Signtaure-based Reliability Analysis.- Design for Robustness.- Summary and Extensions.

ALTRE INFORMAZIONI

• Condizione: Nuovo
• ISBN: 9789400797987
• Collana: Lecture Notes in Electrical Engineering
• Dimensioni: 235 x 155 mm
• Formato: Brossura
• Illustration Notes: XII, 124 p.
• Pagine Arabe: 124
• Pagine Romane: xii